GDS Die Photo Nanoscale Cap Measurement & DCIM Macro - FeFET(PDK: GF28SLPe) GF 28nm FeFET 2025 aF-resolution on-chip nvCAP C–V characterization across scaled geometries & 4-kb FeFET non-volatile digital compute-in-memory macro with power-gating GDS Die Photo ACIM Macro - FeFET(PDK: GF28SLPe) GF 28nm FeFET 2024 4-kb FeFET compute-in-memory macro with 64×64 crossbar array and on-chip 4-bit Flash ADC.
