Announcement_esserc

Our paper “aF-Resolution On-Chip Characterization of Sub-fF Non-Volatile Capacitance in Nanoscale FeFET” has been accepted for oral presentation at 2026 IEEE ESSERC, to be held in Palma de Mallorca, Spain, September 7–10, 2026. This work directly measures the on/off ratio of 1um x 1um ~ 200 nm × 200 nm nvCAP devices on-chip, exploring the scalability of data intensive nvCAP-based edge AI accelerators.